Reflection spectroscopic ellipsometry investigations of reciprocal interactions between organic-inorganic layered structures
Date
2008
Authors
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Journal ISSN
Volume Title
Publisher
Abstract
Description
Dottorato di Ricerca in Science and Technology of Mesophases and Molecular Materials Ciclo XXI SSD, a.a. 2007-2008
Keywords
Fisica, Spettrometria, Film sottili